Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.

Goh, Patrick and Ain, Mohd Fadzil (2014) Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. In: Seoul International Conference On Applied Science & Engineering 2014, 29 - 31 August 2014, Seoul, Korea Selatan. (Submitted)

[img]
Preview
PDF
Download (338kB) | Preview

Abstract

With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.

Item Type: Conference or Workshop Item (Paper)
Subjects: T Technology > TK Electrical Engineering. Electronics. Nuclear Engineering > TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Divisions: Kampus Kejuruteraan (Engineering Campus) > Pusat Pengajian Kejuruteraaan Elektrik & Elektronik (School of Electrical & Electronic Engineering) > Conference or Workshop Item
Depositing User: Mr. Hazaralie Ramlee
Date Deposited: 20 Oct 2014 06:42
Last Modified: 20 Nov 2017 07:22
URI: http://eprints.usm.my/id/eprint/28202

Actions (login required)

View Item View Item
Share