On-wafer noise figure characterization for radio frequency integrated circuits.

Mohd, Shukri Korakkottil Kunhi (2011) On-wafer noise figure characterization for radio frequency integrated circuits. Masters thesis, Universiti Sains Malaysia.

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Abstract

Kaedah nyah-benaman pengukuran Angka Hingar (AH) atas-wafer untuk Litar Bersepadu Frekuensi Radio (LBFR) dibentangkan dalam tesis ini. Ini diikuti dengan analisa ketakpastian gandaan untuk menyiasat pengaruh pengukuran skalar dan vektor terhadap AH. A de-embedding method of an on-wafer Noise Figure (NF) measurement for Radio Frequency Integrated Circuit (RFIC) is presented in this thesis. This is then followed by gain uncertainty analysis to investigate the influences of scalar and vector measurements on the NF.

Item Type:	Thesis (Masters)
Subjects:	T Technology > TK Electrical Engineering. Electronics. Nuclear Engineering > TK1-9971 Electrical engineering. Electronics. Nuclear engineering
Divisions:	Kampus Kejuruteraan (Engineering Campus) > Pusat Pengajian Kejuruteraaan Elektrik & Elektronik (School of Electrical & Electronic Engineering) > Thesis
Depositing User:	Mr Erwan Roslan
Date Deposited:	19 Jul 2018 07:04
Last Modified:	26 Jul 2018 06:51
URI:	http://eprints.usm.my/id/eprint/41103

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