Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects.

Goh, Patrick and Ain, Mohd Fadzil (2014) Fast S-parameter Convolution for Eye Diagram Simulations of High-speed Interconnects. In: Seoul International Conference On Applied Science & Engineering 2014, 29 - 31 August 2014, Seoul, Korea Selatan. (Submitted)

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    Abstract

    With the increase in signal frequency and the complexity of high-speed interconnects, signal integrity has become a prominent issue in modern electronic devices.

    Item Type: Conference or Workshop Item (Paper)
    Subjects: T Technology > TK Electrical Engineering. Electronics. Nuclear Engineering > TK1-9971 Electrical engineering. Electronics. Nuclear engineering
    Divisions: Kampus Kejuruteraan (Engineering Campus) > Pusat Pengajian Kejuruteraaan Elektrik & Elektronik (School of Electrical & Electronic Engineering) > Conference or Workshop Item
    Depositing User: Mr. HR
    Date Deposited: 20 Oct 2014 14:42
    Last Modified: 20 Nov 2017 15:22
    URI: http://eprints.usm.my/id/eprint/28202

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